> ## Documentation Index
> Fetch the complete documentation index at: https://docs.emergence.ai/llms.txt
> Use this file to discover all available pages before exploring further.

# CRAFT Semiconductor Overview

> Overview of the CRAFT semiconductor fab analytics platform for AI-assisted data analysis, workflow orchestration, and manufacturing insights.

# Semiconductor Analytics

The Semiconductor solution provides AI-assisted data analytics for semiconductor fabrication (fab) environments. It enables fab engineers to query manufacturing data using natural language, run automated analysis workflows, and gain insights into production processes, the AI agent generates and executes Python code on behalf of the engineer.

## Who Is It For

<CardGroup cols={2}>
  <Card title="Fab Engineers" icon="microchip">
    Analyze manufacturing data, identify yield issues, and investigate process deviations using conversational AI instead of manual SQL queries.
  </Card>

  <Card title="Process Engineers" icon="gears">
    Monitor process parameters, detect drift, and correlate process variables with quality outcomes using AI-assisted analytics.
  </Card>

  <Card title="Quality Engineers" icon="shield-check">
    Track defect rates, analyze wafer maps, and identify root causes of quality issues with automated data exploration.
  </Card>

  <Card title="Operations Leaders" icon="chart-line">
    Access high-level dashboards and generate reports on fab performance, throughput, and equipment utilization.
  </Card>
</CardGroup>

## Key Capabilities

<Tabs>
  <Tab title="Conversational Analytics">
    Fab engineers interact with manufacturing data through a natural-language chat interface:

    * "What is the yield trend for product X over the past 30 days?"
    * "Which tools have the highest defect rates this week?"
    * "Compare process parameters between high-yield and low-yield lots"
    * "Show me wafer map defect patterns for the last 100 wafers"

    The system generates Python analysis code, executes it in the sandboxed Code Execution service using the platform's data-access layer, and returns results with interactive visualizations.
  </Tab>

  <Tab title="Automated Workflows">
    Prefect-orchestrated workflows automate analysis and data management:

    * **Yield excursion detection**: Automated excursion detection with E1–E7 and parameter detectors, root cause analysis, and report generation (PDF, PPT, DOCX)
    * **Cross-product analysis**: Compare yield and excursion patterns across products
    * **Data ingestion**: Automated data extraction from fab systems (Optimal+)
    * **Feedback learning**: Daily policy refinement from user feedback
  </Tab>

  <Tab title="Data Integration">
    The solution connects to standard semiconductor data sources:

    * Manufacturing Execution Systems (MES)
    * Equipment Data Collection (EDC) databases
    * Wafer test and sort databases
    * Inline metrology measurement databases
    * Defect inspection and review systems
  </Tab>
</Tabs>

## Architecture

The Semiconductor solution follows the same architectural patterns as the other CRAFT solutions:

| Component                    | Role                                                           |
| ---------------------------- | -------------------------------------------------------------- |
| **Conversational interface** | Natural-language queries against fab data                      |
| **AI agents**                | Pydantic AI agent with MCP tools for fab analytics             |
| **Code execution**           | Sandboxed Python execution for data analysis and visualization |
| **Workflow engine**          | Prefect workflows for automated analysis pipelines             |
| **Platform integration**     | Authentication, authorization, and data connections            |

### Platform Integration

The Semiconductor solution integrates with the shared CRAFT:

* **Authentication**: Keycloak OIDC with organization-specific user management
* **Authorization**: JWT-based access control with organization-scoped data queries
* **Data connections**: Database connections managed via the data source connection system
* **Multi-tenancy**: All data isolated per organization

<Note>
  The Semiconductor solution operates as an independent platform with its own microservices (Backend API, AI Agent, MCP Server, Client Dashboard), shared library, and infrastructure. See the detailed architecture documentation for the full system design.
</Note>

## Semiconductor-Specific Analytics

| Analysis Type           | Description                                                                              |
| ----------------------- | ---------------------------------------------------------------------------------------- |
| **Yield analysis**      | Lot-level and wafer-level yield calculation and trending                                 |
| **Excursion detection** | Automated detection of yield anomalies using E1–E7, WAT, WSP, and multivariate detectors |
| **Process correlation** | Statistical correlation between process parameters and quality outcomes                  |
| **Bin analysis**        | Test bin distribution analysis and Pareto charts                                         |
| **Report generation**   | Automated RCA and insight reports exportable as PDF, DOCX, and PPT                       |
| **SPC monitoring**      | Control chart generation with out-of-control detection                                   |

## Data Model

The solution understands standard semiconductor manufacturing data structures:

| Entity                      | Description                                                                                                |
| --------------------------- | ---------------------------------------------------------------------------------------------------------- |
| **Products**                | Semiconductor device families, characterized by technology node, foundry, and business unit                |
| **Lots**                    | Manufacturing batches with user-friendly IDs (e.g., `L2401-001`) for natural reference in chat and reports |
| **Wafers**                  | Individual wafers within lots with WAT, WSD, and FTD measurements                                          |
| **Excursion Events**        | Detected yield anomalies with detector type, severity, and affected lots/wafers                            |
| **Reports**                 | Generated analysis reports (RCA, Insight) with sections, charts, and export support                        |
| **Workflow Runs**           | Execution records for Prefect workflows with inputs, status, and outputs                                   |
| **Policies**                | Learned excursion detection rules with versioning from user feedback                                       |
| **Alerts**                  | Notifications triggered by excursion detection or workflow events                                          |
| **Data Source Connections** | Configured connections to external fab data systems                                                        |